Nanovac AFM Atomic Force Microscope

Product Description

• Tenfold gain of Q-factor. By further vacuum pumping, Q-factor variations become insignificant and nearly flat variations are observed. The sensitivity gain is especially important for the light forces measuring.
• Vacuum system provides the proper purity of processes. It will be definitely much less dust and particles around and therefore less interference with Nano-scanning.
• There is much less water on the samples surface and in the probe-sample environment so that capillary forces between the probe and the sample are ignorable. This raises the force measurement accuracy that is useful for all different modes of Ara research AFM.
• Owing to the high vacuum one can carry out investigations in very low temperatures without hoarfrost on the samples surface.

Nano-ara software ver 1.*1 includes

•  Ability to accept Hysteresis and nonlinearity Enhancement correcting factors Nano Vac.
• Surface slope compensation
• User interface environment
• Control parameters Adjustment.