Very Low Frequency (VLF) High Voltage Tester

Product Description

VLF (Very Low Frequency) Testers are suitable for testing power cables, transformers, switchgear, rotating machinery and other electrical apparatus.

the product has features as follows:

1. Data of current, voltage, wave form can be directly sampled at high voltage side, so the data is real and accurate.

2. Overvoltage protection: If the output exceeds the set limit of voltage, the instrument will shut-down to protect itself, the actuation time is less than *0ms.

3. Overcurrent protection: It is high-low voltage dual protection in the design, the accurate shut-down protection can be made according to the set value at high voltage side; If the current on low voltage side exceeds the rated current, the instrument will take shut-down protection, the actuation time are both less than *0ms.

4. A high voltage output protective resistor is provided in the voltage boost body in the design and this eliminates the need of additional protective resistor connected outside.

Technical parameters:

1. Output voltage ratings: *0KV, *0KV, *0KV, *0KV, *0KV, *0kV (peak)
2. Output frequency: 0.1Hz, 0.*5Hz, 0.*2Hz
3. Measurement accuracy: 3%
4. Positive and negative voltage peak errors: ? 3%
5. Voltage wave form distortion: ? 5%
6. Use condition: Indoor and outdoor; Temperature: **0C*-**0C; Humidity: ? *5%RH
7. Power: AC*0Hz, **0V **5%
8. Power supply fuse tube: *0A

VLF Advantages:�����

1. Easiest to use Fully automatic microcontroller
2. Built-in printer������������������������������
3. True sine wave output
4. Real-time display of actual output waveform��������
5. Ergonomic, menu guided, large backlit LCD
6. Storage of test results for later retrieval and print.
7. Over voltage and current protected
8. Variable frequency 0.1Hz, 0.*5Hz, 0.*2 Hz
9. Data of current, voltage and waveform directly sampled at HV side.
*0. AC testing does not degrade good cable insulation
*1. Harmful space charges are not injected into the cable insulation
*2. No traveling waves are generated during testing
*3. Rugged and reliable design less prone to failure from transients
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